TÜV Rheinland reveals first PV manufacturers with new LeTID test certificates

TÜV Rheinland has awarded the first small group of PV module manufacturers with certification against LeTID (Light and elevated Temperature Induced Degradation), also known as Carrier Induced Degradation (CID), according to a new LeTID testing standard (2 PfG 2689/04.19), which has been under development for almost two years. According to PV-Tech, TÜV Rheinland issued the world's first LeTID certificates to five China-based PV module manufacturers, which included four ‘Solar Module Super League’ (SMSL) members; JinkoSolar, Trina Solar, LONGi Solar and GCL System Integration (GCL-SI) as well as China/Astronergy. LeTID stands for Light and elevated Temperature Induced Degradation and it had first been observed on mc-Si PERC cells. It is an effect which is also visible and detrimental in Cz-Si PERC modules causing very severe degradation, sometimes more than 10% relative in power after weeks of accelerated LeTID degradation. --------------------***-------------------- Source:http://ow.ly/WD5Z50uIRFB Photo:http://ow.ly/ON1K50uIRFA ……………………………………. ‘All rights to go to the author of the news & image as mentioned above’ ------------------------------------------- #TÜVRheinland

TÜV Rheinland reveals first PV manufacturers with new LeTID test certificates

TÜV Rheinland has awarded the first small group of PV module manufacturers with certification against LeTID (Light and elevated Temperature Induced Degradation), also known as Carrier Induced Degradation (CID), according to a new LeTID testing standard (2 PfG 2689/04.19), which has been under development for almost two years.
According to PV-Tech, TÜV Rheinland issued the world’s first LeTID certificates to five China-based PV module manufacturers, which included four ‘Solar Module Super League’ (SMSL) members; JinkoSolar, Trina Solar, LONGi Solar and GCL System Integration (GCL-SI) as well as China/Astronergy.
LeTID stands for Light and elevated Temperature Induced Degradation and it had first been observed on mc-Si PERC cells. It is an effect which is also visible and detrimental in Cz-Si PERC modules causing very severe degradation, sometimes more than 10% relative in power after weeks of accelerated LeTID degradation. ——————–***——————–
Source:ow.ly/WD5Z50uIRFB
Photo:ow.ly/ON1K50uIRFA
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‘All rights to go to the author of the news & image as mentioned above’
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#TÜVRheinland

‘All rights go to the author of the news and image mentioned above’

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Date: Jun 22, 2019 @ 15:30

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